Products
Agilent 4156C - Precision Semiconductor Parameter Analyzer
The Agilent
4156C is the next generation of the Agilent 4156B Precision Semiconductor
Parameter Analyzer. The 4156C provides highly accurate laboratory bench top
parameter analyzers for advanced device characterization. The superior
low-current and low-voltage resolution and built-in quasi-static CV measurement
capability of the 4156C provide a firm foundation for future expansion with
other measurement instruments.
Agilent E5270B 8-slot Precision Measurement Mainframe
The Agilent E5270B is completely user-configurable. You can install up to eight single-slot modules (such as the Atto Level HRSMU or MPSMU), up to four dual-slot modules (such as the HPSMU), or any physically allowable combination thereof.
Agilent E5250A –10x12 Low Leakage Switch Mainframe
The Agilent E5250A
low-leakage switch mainframe expands a single measurement station, such as the
Agilent 4155C, 4156C or E5270 series, to an automated measurement system.
Plug-in modules can be configured either as a cross-point matrix for general
parametric measurements or as a multiplexer for long-term reliability
measurements.
When configured as a
24 (8 x 3) Channel Multiplexer, the E5250A is ideal for long term reliability
measurements with its 384 channel capability and advanced features typically
found only on large, more costly input devices. This allows inexpensive power
suppliers to be used for consistent stressing.
The large number of
channels and low-cost stress sources allow efficient testing of hundreds of
devices in parallel, saving cost and time and achieving accurate, consistent
results.
Agilent B2201A 14ch Low Leakage Switch Mainframe
The Agilent B
Agilent B1500A Semiconductor Device Analyzer
The Agilent B
Agilent 41000 IPACE
The 41000 Series solution solves the most common challenges facing parametric instrument users who require high-resolution 1 fA performance all the way to the interface of the probe card needle and the wafer. Four standard 41000 Series configurations come pre-racked and cabled. Two are positioner-based solutions and two include a new high-performance switching matrix with a new probe card interface. These integrated solutions eliminate the tedious and confusing job of racking, cabling, and verifying the performance of parametric instruments.
With the PLT1000 semiconductor test system, Production Line
Testers has what may be the fastest, most reliable, and lowest cost
solution for testing low-to-medium complexity integrated circuits. Similar to
the TMT ASL-1000, the PLT1000 has a test head
capable of supporting up to 15 instrument cards, while keeping the space
requirements to a minimum. Choose from more than a
dozen instruments, including vector-based digital I/O, multi-channel
VI-sources, +/-5A current source, picoammeter, time-interval analyzer, etc.
Parametric Tester with Optional Relay Matrix
The IC100 is an automatic, multi-channel, parametric test system for DC
analysis of integrated circuits, discretes, and other
devices.
From 2 to 16 Voltage/Current Sources are offered. An optional relay matrix with
up to 512 relays is also available.
There are 2 sections to the software. The first uses a spreadsheet GUI to
program the sources, set spec limits, and perform automatic
testing for wafer sort and final testing. The second software section provides
a curve-tracer (pin-analyzer) GUI for engineering, QA,
and reliability test.
Mixed-Signal Tester with I2C & SPI Testing
Capabilities
The 100-S packs a variety of fast and powerful instruments into
a small box at a small price.
This rugged little tester is fully capable of high volume production testing.
It includes everything needed to test most low-to-medium
complexity analog, digital, and mixed-signal IC's. It is the perfect choice
when testing devices with serial interfaces like I2C and SPI.