Metrics ICV – (I-V, C-V Characterization) Automation Software
Not Available for now
Not Available for now
Key Features & Specifications
Key Features & Specifications
Metrics ICV includes support for semiconductor parameter analyzers, C-V meters, low leakage switch matrices, and full or semi-automatic probe stations. The software provides a wizard based operator test environment, test execution and sequencing along with data logging and post-analysis. Metrics ICV software supports all aspects of parametric test, from basic measurements using a test fixture or manual prober to full test automation across the wafer utilizing a switching matrix, probe card and automated probe station.