Probing
We offer a wide range of various probe systems from affordable compact manual probers for R&D to high‐end 300mm semi‐automatic and fully automatic probe systems for ‐65degC to +300degC thermal tests for either laboratory and cleanroom production testing. Also, we offer the cryogenic probing system in a vacuum environment that supports temperature tests at ultra-low temperatures on 4.2k levels up to ~+200°C. We can customize the most suitable probing solution that matches your measurement application. Our probe systems correspond to a wide variety of applications from ultra-low signal tests to high power device tests, from DC parametric measurement to RF measurement, wafer-level reliability tests, magnetic field impression measurements, and optical device measurements.

RF Probe
Feature
Low insertion loss and return loss. Air coplanar design. Small Probe Mark Wide range of pitch selection. Probe Tip Replacement service available. (Limited times replacement)
Adjustable Dual RF Probe
Custom Design RF Probe (RF Cantilever Probe)
DC + RF Probe
DC Probe
Calibration Substrate
Adjustable Dual RF Probe
Feature
- Adjust between GS/SG, GSG/GSG, or S/S up to 4,000um (4mm / X axis only)
- Easy handling, micrometer structure. (Patented)
- Low Insertion Loss and Return Loss up to 67GHz.
- RF Air Coplanar probe (require uniformed pitch and configuration) , OR Custom Fabrication RF Cantilever probe available. (cannot be mixed air coplanar probe)
Custom Design RF Probe (RF Cantilever Probe)
- Low Insertion Loss and Return Loss up to 67GHz
- RF Cantilever probe technology. Custom Fabrication
- Unique configuration, un-uniformed pitch, different tip planarity alignment available.
- Max 10 RF ports available.
- High Power probe available.
- Non Initial Cost requirement, Short lead time.
- Custom design Calibration kit available.
DC + RF Probe
Feature
- Low Insertion Loss and Return Loss up to 67GHz.
- RF Air Coplanar probe (require uniformed pitch and configuration) , OR Custom Fabrication RF Cantilever probe available. (cannot be mixed air coplanar probe)
- Cantilever DC Probes up to around 25pins (depend on pitch requirement)
- Minimum 50um pitch available
RF Pin Type | Frequency (GHz) | Spec |
---|---|---|
Uniformed Pitch and configuration | 40 | |
50 | ||
67 | ||
Un-Uniformed Pitch / Custom configuration | Max 67 | TBD |
DC Probe
Feature
- Minimum 50um pitch available.
- Up to 34pin (standard) / Please ask above 34pin availability.
- Custom Fabrication Cantilever probes.
- Long life cycle, Durable
- Non Initial Cost requirement.
Number of Pin Count | Spec |
---|---|
1 to 14 | |
14 to 26 | |
26 to 34 |
Calibration Substrate
Feature
- Accurate resistance value control (+/- 0.003%)
- SOLT / TRL calibration available
- Custom design available
Configuration | Available Pitch (um) | |
---|---|---|
Min | Max | |
GS (SG) | 50 | 1000 |
GSG | 50 | 1000 |
GSSG | 50 | TBD |
GSGSG | 50 | 1000 |
Custom Design | Please ask |